CHEN Ji, WU Hongming, ZHU Yongfeng,  ZHOU Jianxiong. Key Point Selection for High-resolution Range Profile Technology Based on Three-dimensional Scattering Center Model[J]. JOURNAL OF SIGNAL PROCESSING, 2021, 37(9): 1709-1718. DOI: 10.16798/j.issn.1003-0530.2021.09.015
Citation: CHEN Ji, WU Hongming, ZHU Yongfeng,  ZHOU Jianxiong. Key Point Selection for High-resolution Range Profile Technology Based on Three-dimensional Scattering Center Model[J]. JOURNAL OF SIGNAL PROCESSING, 2021, 37(9): 1709-1718. DOI: 10.16798/j.issn.1003-0530.2021.09.015

Key Point Selection for High-resolution Range Profile Technology Based on Three-dimensional Scattering Center Model

  • Different from the traditional explosive weapon, collision kill is gradually used in many fields, such as interception, armor breaking and so on, because of its advantages of concentrated damage.In this paper,the problem of High-resolution Range Profile Technology is essentially based on the sliding maximum matching principe,and the best matching position between the template and the matching image is regarded as the location of actual attack target.In this paper,an attack point selection method for High-resolution Range Profile based on three-dimensional scattering center model is proposed.By obtaining the prior information of the three-dimensional structure of the target,and taking the SAR image as the precondition,the specific position of the target attack position in the two-dimensional image is determined by the three- dimensional model,and then the one-dimensional scattering point sequence is determined by projection.According to the sliding maximum matching principle,the range profile position corresponding to the strike point in the one-dimensional scattering point sequence template is regarded as the actual position of the attack position.This method has small computational complexity and is easy to implement,so it has strong practical significance.
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